Metorex, Inc. (Metorex), manufactures, sells, rents, leases, and provides analytical and repair services for its X-MET line of field portable X-ray fluorescence (FPXRF) analyzers. The latest X-MET models in this series of instruments are the 920 and 940 X-MET systems. The X-MET 920 series includes the X-MET 920-P and 920-MP. The X-MET analyzers are specifically calibrated for on-site or in situ hazardous waste analysis. These analyzers provide rapid, nondestructive measurements of inorganic contaminants in soil, thin film such as lead in paint, or water matrices.
Each X-MET 920 series analyzer is built from modules into systems based on customers' analytical and logistical needs. X-MET PC System (XPCS) can either be built into the expansion slot of the computer or is provided as a standalone, battery- operated XPCS module for direct interface to a computer's RS-232 port. The X-MET 940 is a custom, miniaturized, field-hardened, battery-operated, DOS-based computer which is dedicated to field XRF application. The system uses a flash or electronic hard disk to provide extreme durability under field operating conditions. It is among the smallest, lightest commercially available FPXRF with the full range of analytical capabilities.
The X-MET 920-P is equipped with a solid state Si(Li) contained in a hand-held probe. The X-MET 920 MP is equipped with a gas-filled proportional counter detector contained in a hand-held probe. The basic analyzer configuration includes the PC, XRF software, XPCS, and the analysis probe with excitation source. The XPCS contains a 2,048-channel multichannel analyzer (MCA) that collects, analyzes, and displays the X-ray pulse-height spectrum. The high-resolution Si(Li) detector is liquid nitrogen cooled by a 0.5-liter dewar built into the probe. The gas-filled proportional detector operates at ambient temperatures. Metorex offers iron55, cadmium109, and americium241 radioisotope excitation sources. Dual source configurations are available.
All software is menu driven. These instruments are factory-calibrated and can be field-calibrated using either empirical calibration or standardless-fundamental parameters (FP). Empirical calibration requires a set of site-typical or analyzed site-specific samples for the initial calibration. FP calibration requires one certified standard. Metorex claims that 50 or more soil samples can be analyzed in an 8- to 10-hour day with intrusive sampling, rigorous sample preparation, and long measurement times (200 to 300 seconds per sample) and up to 200 samples per day with in situ screening and short (10 to 100 seconds per sample) measurement times.
The X-MET 920-P, equipped with a Si(Li) detector, dual radioisotope sources, and a portable sealed computer, sells for $47,950. The X-MET 920 MP sells for $36,325 and the X-MET 940 sells for $62,430. These prices include factory training for two people at the Metorex facility. The X-MET can also be rented or leased from Metorex.
The X-MET technology is designed to identify more than 60 elements in soil or other matrices, such as those at mining and smelting sites, drum recycling facilities, or plating facilities. The instrument can provide real-time, on-site analytical results during field screening and remediation operations. FPXRF analysis is faster and more cost-effective compared to conventional laboratory analysis.
The X-MET 920-P, 920-MP, and 940 were evaluated under the SITE Program in April 1995. The instruments were used to identify and quantify concentrations of metals in soils. A preliminary evaluation of the results yielded field-based method detection limits, accuracy, and precision data from the analysis of standard reference materials and performance evaluation samples. Comparability of the FPXRF results to an EPA-approved reference laboratory method was also assessed. A SW-846 method for FPXRF analysis of soils is scheduled to be published in 1996. The results from the evaluation of the X-MET 920-P and 940 analyzers were combined in a single report. Results from the evaluation of the X-MET 920-MP analyzer were reported in a separate report. A comprehensive evaluation of all results will be presented in a technical report from EPA in 1997.
EPA PROJECT MANAGER:
Stephen Billets
U.S. EPA
National Exposure Research Laboratory
Characterization Research Division
P.O. Box 93478
Las Vegas, NV 89193-3478
702-798-2232
Fax: 702-798-2261
TECHNOLOGY DEVELOPER CONTACT:
James Pasmore
Metorex, Inc.
1900 N.E. Division Street, Suite 204
Bend, OR 97701
800-229-9209
541-385-6748
Fax: 541-385-6750